Critical Dimension Scanning Electron Microscopy (CD-SEM) is a specialized technique used for high-resolution imaging and precise measurement of nanoscale structures in semiconductor manufacturing ...

To facilitate the development of these ultrafast semiconductor ... instrument for performing scanning electron microscopy (SEM) of a photoconductive antenna device on a GaAs substrate and obtained ...

The Semiconductor Materials and Devices (SMD) group is internationally leading in the epitaxy of semiconductor materials, electron microscopy of devices and materials, and the design, fabrication and ...

Researchers at the University of California Santa Barbara (UCSB) used the scanning ultrafast ... the ability of electron microscopy to study semiconductor devices.

for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron microscopes (FIB-SEMs). ZEN stands for ZEISS Efficient Navigation and lets microscopists ...