News

C&EN1d
Observation of a Brine Layer on an Ice Surface with an Environmental Scanning Electron Microscope at Higher Pressures and Temperatures
† Department of Chemistry, Faculty of Science, Masaryk University, Kamenice 5, 62500 Brno, Czech Republic ‡ RECETOX, Faculty of Science, Masaryk University, Kamenice 5, 62500 Brno, Czech Republic ...
C&EN2d
Surface Characterization of Oxidized Myofibrils Using X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy
Changes in surface characteristics of myofibrils after chemical oxidation were elucidated using X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy. Myofibrils were oxidized by a ...
Science Daily4d
Mind the band gap! -- researchers create new nanoscale forms of elementary semiconductor with tunable electronic properties
Researchers have demonstrated that by using a semiconductor with flexible bonds, the material can be moulded into various structures using nano containers, without altering its composition, the ...
Significant reinforcement in the north: Innovative laboratories in Nof Hagalil
With an investment of millions of shekels and in honor of the 75th anniversary of UCT Fluid Solutions, the company ...
IEEE5d
NanoNeRF: Robot-assisted Nanoscale 360° reconstruction with neural radiance field under scanning electron microscope
Abstract: The pursuit of 3D reconstruction from 2D images for nanomanipulation under scanning electron microscopy stands as a critical research endeavor. Previous methods either necessitates ...
Semiconductor Engineering6d
Overview Of 103 Research Papers On Automatic SEM Image Analysis Algorithms For Semiconductor Defect Inspection (KU Leuven, Imec)
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: ...