We’ve all likely seen the amazing images possible with a scanning electron microscope. An SEM can yield remarkably detailed 3D images of the tiniest structures, and they can be invaluable tools ...

Critical Dimension Scanning Electron Microscopy (CD-SEM) is a powerful tool that enables researchers and manufacturers to visualize and quantify nanoscale features with incredible accuracy, playing a ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...

The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...