Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...

Thermo Scientific Scios 2 Dual-beam Focus Ion Beam/ Scanning Electron Microscope (DB FIB/SEM) equipped with ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

The technique involves directing a focused beam of electrons onto a sample and ... thanks to the fine electron probe it utilizes. Scanning Transmission Electron Microscopy (STEM) and Transmission ...

make the scanning electron microscope one of the most useful instruments in research today. The SEM is an instrument that produces a largely magnified image by using electrons instead of light to form ...

The Thermo Scientific™ Aquilos™ 2 Cryo-FIB is the first cryo-DualBeam™ (focused ion beam/scanning electron microscope) system dedicated to preparation of frozen, thin lamella samples from biological ...

A Scanning Electron Microscope uses a targeted beam of high-energy electrons on a test sample to produce an image or detect specific details. Electron-sample interactions can reveal a lot about a ...

Advancing Focused Ion Beam Technology for Semiconductor Innovation Failure Analysis and Counterfeit Detection. • Expanding Focused Ion Beam Applications in Nanotechnology Biomedical Research ...

Universal software designed to operate any ZEISS light or electron microscope Easy ... operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron ...