The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...

In this protocol, we describe a 3D imaging technique known as 'volume electron microscopy' or 'focused ion beam scanning electron microscopy (FIB/SEM)' applied to biological tissues. A scanning ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results.

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...

Thermo Scientific Scios 2 Dual-beam Focus Ion Beam/ Scanning Electron Microscope (DB FIB/SEM) equipped with ...

Universal software designed to operate any ZEISS light or electron microscope Easy ... operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron ...

[Ben Krasnow] has recently completed a home-built scanning electron ... from the top of the microscope downwards through a long copper column. Along the way the beam is focused and manipulated ...