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green STEM probes are labeled for regions of the sample with one layer, vacuum, and two layers. (Image: Microscopy and Microanalysis, Volume 25, Issue 3, June 2019, pp. 563-582, CC BY 4.0) In 4D-STEM, ...
Knowledge of the microscopic structure and composition of materials is essential for understanding their properties and designing functional devices. Microscopy techniques based on electrons and X ...
Ultrafast electron microscopes, first developed in the 2000s, utilize lasers to generate pulsed electron beams, significantly enhancing the temporal resolution—the ability to observe changes in ...
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Oxford Mail on MSN£3m electron microscope arrives at University of OxfordUse precise geolocation data and actively scan device characteristics for identification. This is done to store and access ...
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